4mm Rotated (45°) LTE Mode

The length thickness extensional mode in a 4mm symmetry material occurs in specimens with the following geometry;

The arrow represents the sample poling direction. The limits in dimension should ensure that the resonance will be free of coupling with other resonance modes. In the rotated LTE mode used by PRAP, the poling and specimen electrode surfaces are rotated 45° about the 'c' axis of the crystal system.

The resonance observed in the sample admittance is described by the following equation;

The LTE mode rotated 45° about the 'c' (Z) axis is required to construct the complete 4mm piezoelectric matrix. The PRAP 4mm piezoelectric matrix tool recognises results for this mode when computing the complete 4mm matrix from the contents of a compound file.

By fitting this equation to the observed resonance, the following material properties can be determined;

k₁₃^45:Z, s₁₁^E45:Z, d₁₃, g₁₃, e₃₃^T

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